Retracted: Encircling probe with multi-excitation frequency signal for depth crack defect in eddy current testing

  • J. K. S. Paw
  • K. Ali
  • C.K. Hen
  • A.N. Abdallah
  • T.J. Ding
  • N.A. Ahlam
  • N. Eirfan
Keywords: NDT, encircling, hole defect, transverse, longitudinal.


This article was withdrawn and retracted by the Journal of Fundamental and Applied Sciences and has been removed from AJOL at the request of the journal Editor in Chief and the organisers of the conference at which the articles were presented ( Please address any queries to


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eISSN: 1112-9867