Use of X-Ray Fluorescence Spectrometry to Determine Trace Elements in Graphite
This paper deals with application of X-ray fluorescence spectrometry for the detection of trace elements in graphic. An X-ray spectrometer was constructed and used to carry out measurements on graphite spheres impregnated with different chemical elements. The intensities of the lines of these trace elements, as function of concentration, were measured in order to establish the sensitivity of the spectrometer. These measurements have shown that X-ray fluorescence methods can easily be employed for detection of trace elements in graphite samples with conventional X-ray tubes, the sensitivity of the spectrometer was about 29 ppm for Zr.