The influence of Si (Li) detector characteristics on the accuracy in X-ray analysis using the QXAS package

  • F.G. Ofosu Physics Dept., National Nuclear Research Institute, G.A.E.C. P.O. Box 80, Legon, Accra, Ghana.
  • S. Akoto Bamford Physics Dept., National Nuclear Research Institute, G.A.E.C. P.O. Box 80, Legon, Accra, Ghana.
  • I.J.K. Aboh Physics Dept., National Nuclear Research Institute, G.A.E.C. P.O. Box 80, Legon, Accra, Ghana.

Abstract



A study has been carried out to show how variations in Si(Li) detector characteristics affect the accuracy of X-ray spectra evaluation. The detector characteristics investigated are Be window thickness, Au layer, Si dead layer and Si Detector Sensitive volume. For each of the detector parameters, different thickness values including the manufacturer's specified values were chosen to calculate detector efficiency using the spectra obtained from Cr2O3, Co, Cu, Zn and As standards. An IAEA-sponsored package, “Quantitative X-ray Analysis Software (QXAS)” was used for the work. An inverse variation of efficiency values with thickness in the Be window, Au layer and Si Dead layer was realised. The Gold layer was found to have the most significant effect, followed by the Si Detector Dead Layer with the Be Window having least significant effect. The Detector sensitive volume showed no observed effect.

JOURNAL OF THE GHANA SCIENCE ASSOCIATION Volume 2 No. 1 (2000) pp. 59-63
Published
2004-05-25
Section
Articles

Journal Identifiers


eISSN: 0855-3823