Automatic test pattern generation for iterative logic arrays

  • KO Boateng Department of Electrical and Electronic Engineering, School of Engineering, KNUST

Abstract

In this work, measures to evaluate fault-effect propagation of test patterns of a C-test are first formulated. Next, the repetition property of the test patterns is exploited to develop a method for generating C-tests for ILAs under the cell fault model. Based on the results of test generation, the method identifies points of insertion of extra hardware in order to achieve C-testability for the target array. Finally, results obtained by applying the proposed method to generate minimum C-tests for a few well-known arithmetic arrays are shown.
Journal of Science and Technology Vol.24(2) 2004: 1-7
Published
2005-04-29
Section
Articles

Journal Identifiers


eISSN: 0855-0395