Modelling of a total reflection X-ray fluorescence (TXRF) system

  • OO Adejumo
  • JO Ojo

Abstract

A robust computer program to simulate X-ray fluorescence (XRF) system and particularly applied to the total reflection mode is presented in this paper. The simulation of the different stages involved in x-ray fluorescence emissions was carried out by writing a suite of computer programs using FORTRAN programming language. These computer simulated XRF stages were then integrated together to generate a general robust model which was run with the digital visual Fortran 6.0 compiler set-up. The model was validated by comparison with experimental spectrum from the TXRF system in the Physics Department of the Obafemi Awolowo University, Ile-Ife. Trail experiments were carried out with this model to determine optimum conditions for detecting certain elements of interest under various analytical conditions in given samples. Results of these trail experiments show that the detectability of elements improved with increasing applied voltages and atomic number of elements. Variation of geometry such as the glancing incidence angle of the excitation and the nature of the support itself were also observed to effect the detect ability of the elements.

Nigerian Journal of Physics Vol. 16(2) 2004: 97-104
Published
2006-10-18
Section
Articles

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eISSN: 1595-0611