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The influence of background model parameters on the accuracy of X-ray intensity evaluation using the AXIL software

F. G. Ofosu
S. Akoto Bamford
I.J. Kwame Aboh
G. K. Tetteh


Quantitative procedures in Energy-Dispersive X-ray fluorescence (EDXRF) analysis require the conversion of measured X -ray intensities into elemental concentration. Some softwares have been developed for the deconvolution of X-ray spectra, and AXIL is one of such computer programmes. AXIL provides a number of background models that can be used for X-ray intensity evaluation. The choice of the order of the polynomial for the linear and exponential background models and the number of iterations for the smooth filter background model in spectra fitting with the AXIL programme version 3.1 has been investigated using a Cd-109 radioisotope source and a Si(Li) detector. This was carried out by determining the concentration of Ca in CaO, Zn in ZnO, As in As2O3 and Co in its powdered form, using all the possible orders of the polynomial/number of iterations in the three background models. The results showed that the choice of linear model for both sensitivity calibration and sample analysis produces the best results. In all cases the optimum number of parameters for the polynomial/ number of iterations were found to give linear <= 4, exponential <= 4 and smooth filter <= 100.

(Journal of the Ghana Science Association: 2001 3(3): 52-56)

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eISSN: 0855-3823