Minority carrier lifetime in monocrystalline, polycrystalline and amorphous silicon solar cells using photo-induced open-circuit voltage decay (ocvd) technique

  • Ulrich Stutenbäumer
DOI: 10.4314/sinet.v22i1.18131
Published
2004-05-25
Issue
Vol. 22 No. 1 (1999)
Section
Articles
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Journal Identifiers


eISSN: 2520-7997
print ISSN: 0379-2897