Structural analysis and surface morphology of quartz

  • Hassan Usman Jamo
Keywords: Quartz, XRF, XRD, SEM, TGA


The structural analysis and surface morphology of quartz has been studied. Quartz has long been known to be a source of silica. X-ray fluorescence (XRF), X-ray diffraction (XRD) and scanning electron microscopy (SEM) were used to observe the surface and internal structure of the quartz. The results among other things revealed that the quartz consist of mainly silica (SiO2), with crystalline structure, microscopic examination showed that the quartz has a porous cellular structure and consists of irregular-shaped particles. This study implies that quartz is good candidate for various applications by ceramic industries.

Key words: Quartz; XRF;XRD; SEM; TGA


Journal Identifiers

eISSN: 2006-6996
print ISSN: 2006-6996