Bayero Journal of Pure and Applied Sciences
Journal / Bayero Journal of Pure and Applied Sciences / Vol. 1 No. 1 (2008) / Articles
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Published:
Feb 24, 2012
DOI:
Keywords:
analogue simulation transient operational amplifiers amplitude scaling

Article Details

Issue
Vol. 1 No. 1 (2008)
Section
Articles
Copyright is owned by The Faculty of Science, Bayero University

Main Article Content

Simulation of Transient Equilibrium Decay Using Analogue Circuit


NK Abdullahi
US Ango
MA Bato

Abstract

Abstract unavailable.

Key words: analogue, simulation, transient, operational amplifiers, amplitude scaling

Journal Identifiers


eISSN: 2006-6996
print ISSN: 2006-6996
 
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