Improving the psychometric properties of the Mooney problem checklist by using Rasch measurement model

  • M. E. E. M. Matore
  • A. Z. Khairani
  • N. A. Razak
  • M. Mohamad
Keywords: Mooney Problem Checklist, adversities, polytechnic, Raschmeasurement model

Abstract

This study aims to examine the psychometric characteristics of Mooney Problem Checklist
(MPCL) items using the Rasch measurement model framework in the context of
polytechnics. The MPCL with eleven dimensions was administered to 252 respondents who
were selected from seven polytechnic institutions in Malaysia. The analysis was conducted
using WINSTEPS 3.71.0.1 in order to examine the psychometric properties such as item fit statistics, unidimensionality, local independence, item polarity, reliability, separation index and item-person map with reference to Rasch measurement model. The results obtained showed that 244 items from 327 items was found to have fulfilled the main assumptions and measurement criteria of Rasch measurement model. This study provides significant contribution to improving the scale development and validation of MPCL instrument modification using the Rasch measurement model Malaysia.

Keywords: Mooney Problem Checklist; adversities; polytechnic; Raschmeasurement model

Journal Identifiers


eISSN: 1112-9867